Diffuse reflection - Wikipedia, the free encyclopedia
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Diffuse reflection is the reflection of light from an uneven or granular surface such that an incident ray is seemingly reflected at a number of angles. It is the complement to specular reflection. I...
en.wikipedia.org/wiki/Diffuse_reflection
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Reflection from a rough surface in which a collimated beam emerges in all directions. See also: Reflection, Specular Reflection ... Reflection from a rough surface in which a collimated beam emerges in all directions. ... Reflection, Specular Reflection...
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scienceworld.wolfram.com/physics/DiffuseReflection.html
scienceworld.wolfram.com/physics/DiffuseReflection.html
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However, in the real world most objects have convoluted surfaces that exhibit a diffuse reflection, with the incident light being reflected in all directions. This interactive tutorial explores how light waves are reflected by smooth and rough surfaces.
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micro.magnet.fsu.edu/primer/java/reflection/specular/in...
micro.magnet.fsu.edu/primer/java/reflection/specular/index.html
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CiteULike ddasilva's CiteULike ... CiteULike is a free online bibliography manager. Register and you can start organising your references online. ... diffuse, light, specular...
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www.citeulike.org/user/ddasilva/article/1447035
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The solution of the time-dependent multiple scattering problem for reflected radiation from homogeneous slabs with a delta-function input. The basic differential-integral equation for the Laplace transform of the reflected radiation is solved computationally. ... Accession Number : AD0637165 ... Report Date : JUL 1966...
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stinet.dtic.mil/oai/oai?verb=getRecord&metadataPrefix=h...
stinet.dtic.mil/oai/oai?verb=getRecord&metadataPrefix=html&identifier=AD0637165
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Diffuse reflection data are presented for ethyl methylphosphonate in a fine Utah dirt sample as a model system for organophosphate-contaminated soil. ... We believe that this artifact is the result of the mathematical process by which the raw data are converted into Kubelka-Munk units, and we developed a numerical strategy...
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www.medscape.com/medline/abstract/16408921
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Diffuse reflection spectra of semiconductor samples have been measured on a Unicam SP700 spectrophotometer, using large particle sizes and lithium fluoride as a standard.
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www.iop.org/EJ/abstract/0022-3735/5/10/007
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L.B. Wolff. On the relative brightness of specular and diffuse reflection. In Proceedings of IEEE Conference on Computer Vision and Pattern Recognition (CVPR), pages 369--376, Seattle, Washington, June 1994. ... Lawrence B. Wolff. On the relative brightness of specular and diffuse reflection. In Proc. of IEEE Conf. 1994.
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citeseer.ist.psu.edu/context/248314/0
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