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Scanning probe microscopy - Wikipedia, the free encyclopedia
Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the ...
en.wikipedia.org/wiki/Scanning_probe_microscopy |
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Scanning probe microscopy covers several related technologies for imaging and measuring surfaces on a fine scale, down to the level of molecules and groups of atoms.
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The first scanning probe microscope was the scanning tunneling microscope (STM) of Binnig and Rohrer (Binnig, G., Rohrer, H., et al., (1982) Phys. Rev. Lett., 49:57.). Gerd Binnig and Heinrich Rohrer were awarded half of the 1986 Nobel Laureate in Physics for their design of the scanning tunneling microscope.
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The family of scanning probe microscopes uses no lenses, but rather a probe that interacts with the sample surface. The type of interaction measured between the probe tip and the sample surface defines the type of scanning probe microscope being used.
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Scanning tunneling microscope - Wikipedia, the free encyclopedia
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Scanning Probe Microscope | World of Invention. Scanning Probe Microscope summary with 2 pages of encyclopedia entries, research information, and more. ... Search "Scanning Probe Microscope"
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Digital Instruments, Nanoscope Scanning Probe Microscopes ... Scanning Probe Microscopy of DNA Molecules ... Electron Microscope Facility, University of Illinois...
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A technique for the fabrication of single-electron transistors (SETs) on tips for use in scanning probe microscopy is presented. The tips are micromachined out of an MBE-grown AlGaAs–GaAs heterostructure with a trench within each tip.
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A scanning probe microscope (SPM), providing an ultra high vacuum (UHV), gas or liquid environment, is presented. It is intended for nanoscale processing and surface research, such as electron controlled chemical lithography (ECCL).
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A scanning probe microscope comprises scanning control means for controlling raster scanning of an XYZ translator, and displacement detection means for detecting amount of displacement of the XYZ tran ... A scanning probe microscope comprises scanning control means for controlling raster scanning of an XYZ translator,
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